This book covers the spectrum of the testing problem. Areas covered include fault modeling, test generation, fault simulation, memory testing, design for testability, testability measures, PLA testing, and test equipment. The use of this volume will provide a good insight into the VLSI challenges in the area of testing - an area that has become increasingly important due to the emphasis on quality of VLSI products, and the associated costs. As a result, there has been a rapid expansion in the technologies associated with testing, and it is this technological growth which is reflected in the contributions to this volume.
